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  ?2006 fairchild semiconductor corporation 1 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet qfet ? january 2006 fqn1n50c 500v n-channel mosfet features ? 0.38 a, 500 v, r ds(on) = 6.0 ? @ v gs = 10 v ? low gate charge ( typical 4.9 nc ) ? low crss ( typical 4.1 pf) ? fast switching ? 100 % avalanche tested ? improved dv/dt capability description these n-channel enhancement mode power field effect transistors are produced using fa irchild?s proprietary, planar stripe, dmos technology. this advanced technology has been especially tailored to minimize on-state resistance , provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. these devices are well suited for high efficiency switched mode power s upplies, active power factor correction, electronic lamp ballasts based on half bridge topology. to-92 fqn series s d g d g s absolute maximum ratings symbol parameter fqn1n50c units v dss drain-source voltage 500 v i d drain current - continuous (t c = 25c) 0.38 a - continuous (t c = 100c) 0.24 a i dm drain current - pulsed (note 1) 3.04 a v gss gate-source voltage 30 v e as single pulsed avalanche energy (note 2) 44.4 mj i ar avalanche current (note 1) 0.38 a e ar repetitive avalanche energy (note 1) 0.21 mj dv/dt peak diode recovery dv/dt (note 3) 4.5 v/ns p d power dissipation (t a = 25c) 0.89 w power dissipation (t l = 25c) 2.08 w - derate above 25c 0.017 w/ c t j , t stg operating and storage temperature range -55 to +150 c t l maximum lead temperature for soldering purposes, 1/8 " from case for 5 seconds 300 c thermal characteristics symbol parameter typ max units r jl thermal resistance, junction-to-lead (note 6a) -- 60 c / w r ja thermal resistance, junction-to-ambient (note 6b) -- 140 c / w
2 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet package marking and ordering information device marking device package reel size tape width quantity 1n50c fqn1n50c to-92 -- -- 2000ea electrical characteristics t c = 25c unless otherwise noted symbol parameter test conditions min. typ. max. units off characteristics bv dss drain-source breakdown voltage v gs = 0 v, i d = 250 a 500 -- -- v ? bv dss / ? t j breakdown voltage temperature coefficient i d = 250 a, referenced to 25c -- 0.5 -- v/c i dss zero gate voltage drain current v ds = 500 v, v gs = 0 v -- -- 50 a v ds = 400 v, t c = 125c -- -- 250 a i gssf gate-body leakage current, forward v gs = 30 v, v ds = 0 v -- -- 100 na i gssr gate-body leakage current, reverse v gs = -30 v, v ds = 0 v -- -- -100 na on characteristics v gs(th) gate threshold voltage v ds = v gs , i d = 250 a 2.0 -- 4.0 v r ds(on) static drain-source on-resistance v gs = 10 v, i d = 0.19 a -- 4.6 6.0 ? g fs forward transconductance v ds = 40 v, i d = 0.19a (note 4) -- 0.6 -- s dynamic characteristics c iss input capacitance v ds = 25 v, v gs = 0 v, f = 1.0 mhz -- 150 195 pf c oss output capacitance -- 28 40 pf c rss reverse transfer capacitance -- 4.1 -- pf switching characteristics t d(on) turn-on delay time v dd = 250 v, i d = 1.0 a, r g = 25 ? (note 4, 5) -- 10 30 ns t r turn-on rise time -- 10 30 ns t d(off) turn-off delay time -- 20 50 ns t f turn-off fall time -- 15 40 ns q g total gate charge v ds = 400 v, i d = 1.0 a, v gs = 10 v (note 4, 5) -- 4.9 6.4 nc q gs gate-source charge -- 0.66 -- nc q gd gate-drain charge -- 2.9 -- nc drain-source diode characteristics and maximum ratings i s maximum continuous drain-source diode forward current -- -- 0.38 a i sm maximum pulsed drain-source diode forward current -- -- 3.04 a v sd drain-source diode forward voltage v gs = 0 v, i s = 0.38 a -- -- 1.4 v t rr reverse recovery time v gs = 0 v, i s = 1.0 a, di f / dt = 100 a/ s (note 4) -- 188 -- ns q rr reverse recovery charge -- 0.55 -- c notes: 1. repetitive rating : pulse width limited by maximum junction temperature 2. l = 80mh, i as = 1.0a, v dd = 50v, r g = 25 ?, starting t j = 25c 3. i sd 0.38a, di/dt 200a/ s, v dd bv dss, starting t j = 25c 4. pulse test : pulse width 300 s, duty cycle 2% 5. essentially independent of operating temperature 6. a) reference point of the r jl is the drain lead b) when mounted on 3?x4.5? fr-4 pcb without any pad copper in a still air environment (r ja is the sum of the junction-to-case and case-to-ambient thermal resistance. r ca is determined by the user?s board design)
3 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet typical performance characteristics figure 1. on-region characteristics figure 2. transfer characteristics 246810 10 -1 10 0 150 o c 25 o c -55 o c notes : 1. v ds = 40v 2. 250 s pulse test i d , drain current [a] v gs , gate-source voltage [v] 10 -1 10 0 10 1 10 -2 10 -1 10 0 v gs top : 15.0 v 10.0 v 8.0 v 7.0 v 6.5 v 6.0 v 5.5 v 5.0 v bottom : 4.5 v notes : 1. 250 s pulse test 2. t c = 25 i d , drain current [a] v ds , drain-source voltage [v] figure 3. on-resistance variation vs. figure 4. body diode forward voltage drain current and gate voltage v ariation vs. s ource current and temperatue 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 0 5 10 15 20 v gs = 20v v gs = 10v note : t j = 25 r ds(on) [ ? ], drain-source on-resistance i d , drain current [a] 0.2 0.4 0.6 0.8 1.0 1.2 1.4 10 -1 10 0 150 notes : 1. v gs = 0v 2. 250 s pulse test 25 i dr , reverse drain current [a] v sd , source-drain voltage [v] figure 5. capacitance characteristics figure 6. gate charge characteristics 0123456 0 2 4 6 8 10 12 v ds = 250v v ds = 100v v ds = 400v note : i d = 1a v gs , gate-source voltage [v] q g , total gate charge [nc] 10 -1 10 0 10 1 0 100 200 300 400 c iss = c gs + c gd (c ds = shorted) c oss = c ds + c gd c rss = c gd * note : 1. v gs = 0 v 2. f = 1 mhz c rss c oss c iss capacitances [pf] v ds , drain-source voltage [v]
4 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet typical performance characteristics (continued) figure 7. breakdown voltage variatio n figure 8. on-resistance variation vs. temperature vs. temperature -100 -50 0 50 100 150 200 0.8 0.9 1.0 1.1 1.2 not es : 1. v gs = 0 v 2. i d = 250 a bv dss , (normalized) drain-source breakdown voltage t j , junction temperature [ o c] -100 -50 0 50 100 150 200 0.0 0.5 1.0 1.5 2.0 2.5 3.0 notes : 1. v gs = 10 v 2. i d = 0.19 a r ds(on) , (normalized) drain-source on-resistance t j , junction temperature [ o c] figure 9. maximum safe operating area figure 10. maximum drain current vs. case temperature 25 50 75 100 125 150 0.0 0.1 0.2 0.3 0.4 i d , drain current [a] t c , case temperature [ ] 10 0 10 1 10 2 10 3 10 -3 10 -2 10 -1 10 0 10 1 100 ms 1 ms 10 s dc 10 ms 100 s operation in this area is limited by r ds(on) notes : 1. t c = 25 o c 2. t j = 150 o c 3. single pulse i d , drain current [a] v ds , drain-source voltage [v] figure 11. transient thermal response curve 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 3 10 -1 10 0 10 1 10 2 notes : 1. z jl (t) = 60 /w m ax. 2. d uty factor, d = t 1 /t 2 3. t jm - t l = p dm * z qjc (t) single pulse d=0.5 0.02 0.2 0.05 0.1 0.01 z  jc (t), thermal response t 1 , square w ave pulse duration [sec] t 1 p dm t 2
5 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet gate charge test circuit & waveform resistive switching test circuit & waveforms unclamped inductive switching test circuit & waveforms
6 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet peak diode recovery dv/dt test circuit & waveforms
7 www.fairchildsemi.com fqn1n50c rev. a fqn1n50c 500v n-channel mosfet mechanical dimensions 0.46 0.10 1.27typ (r2.29) 3.86max [1.27 0.20 ] 1.27typ [1.27 0.20 ] 3.60 0.20 14.47 0.40 1 .02 0.10 (0.25) 4.58 0.20 4.58 +0.25 ?.15 0.38 +0.1 0 ?.0 5 0.38 +0.10 ?.05 to-92 dimensions in millimeters
disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. trademarks the following are registered and unregistered trademarks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. a critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms datasheet identification product status definition advance information preliminary no identification needed obsolete this datasheet contains the design specifications for product development. specifications may change in any manner without notice. this datasheet contains preliminary data, and supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains final specifications. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains specifications on a product that has been discontinued by fairchild semiconductor. the datasheet is printed for reference information only. formative or in design first production full production not in production isoplanar? littlefet? microcoupler? microfet? micropak? microwire? msx? msxpro? ocx? ocxpro? optologic ? optoplanar? pacman? pop? power247? poweredge? fast ? fastr? fps? frfet? globaloptoisolator? gto? hisec? i 2 c? i-lo ? implieddisconnect? intellimax? rev. i18 acex? activearray? bottomless? build it now? coolfet? crossvolt ? dome? ecospark? e 2 cmos? ensigna? fact? fact quiet series? powersaver? powertrench ? qfet ? qs? qt optoelectronics? quiet series? rapidconfigure? rapidconnect? serdes? scalarpump? silent switcher ? smart start? spm? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 syncfet? tcm? tinylogic ? tinyopto? trutranslation? uhc? ultrafet ? unifet? vcx? wire? across the board. around the world.? the power franchise ? programmable active droop?
careers | sitema go datasheets, samples, buy technical information applications design center support company investors my f a home >> find products >> product status/pricing/packaging fqn1n50c 500v n-channel mosfet general description back to top features back to top contents ? general description ? features ? product status/pricing/packaging ? order samples ? qualification support these n-channel enhancement mode pow er field effect transistors are produced using fairchild?s proprietary, planar stripe, dmos technology. this advanced technology has been especially tailored to minimize on-state resistance, provide superior switchin g performance, and withstand high energy pulse in the avalanche and commutation mode. these devices are well suited for high effi ciency switched mo de power supplies, active power facto r correction, electronic lamp ballasts based on half bridge topology. z 0.38 a, 500 v, r ds(on) = 6.0 ? @ v gs = 10 v z low gate charge ( typical 4.9 nc ) z low crss ( typical 4.1 pf) z fast switching z 100 % avalanche tested z improved dv/dt capability datasheet download this datasheet e - mail this datasheet this page print version product product status pb-free status pricing* package type leads packing method package marking convention** related links request samples how to order products product change notices (pcns) support sales support quality and reliability design cente r pa g e 1 of 2 product folder - fairchild p/n fq n1n50c - 500v n-channel mosfet 17-au g -2007 mhtml:file://c:\temp\FQN1N50CBU.mht
back to top qualification support click on a product for detailed qualification data back to top FQN1N50CBU full production $0.316 to - 92 3 bulk line 1: 1n50c line 2: &3 fqn1n50cta full production $0.316 to - 92 3 ammo line 1: 1n50c line 2: &3 * fairchild 1,000 piece budgetary pricing ** a sample button will appear if the part is available through fa irchild's on-line samples program. if there is no sample butt on, please contact a fairchild distributo r to obtain samples indicates product with pb -free second-level interconne ct. for more information click here. package marking information for product fqn1n50c is available. click here for more information . product FQN1N50CBU fqn1n50cta ? 2007 fairchild semiconductor products | design center | support | company news | investors | my fairchild | contact us | site index | privacy policy | site terms & conditions | standard terms & conditions o pa g e 2 of 2 product folder - fairchild p/n fq n1n50c - 500v n-channel mosfet 17-au g -2007 mhtml:file://c:\temp\FQN1N50CBU.mht


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